Presented by Oxford Instruments Asylum Research
Date: September 13, 2018
Time: 11:30AM - 12:30PM
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The atomic force microscope (AFM) provides unique capabilities for nanoscale characterization of photovoltaic materials and devices. It can probe local electrical and functional response in light or dark conditions with environmental control, and map surface structure with unprecedented resolution. In this webinar, we provide an overview of AFM applications for emerging photovoltaics including hybrid organic-inorganic perovskites and organic semiconductors. Our guest speaker, Dr. Rajiv Giridharagopal, discusses results using standard and advanced modes such as photoconductive AFM, piezoresponse force microscopy (PFM), and time-resolved electrostatic force microscopy. Additional results are presented to further illustrate the power and versatility of AFMs for photovoltaic R&D.
Talk Presentations:
The atomic force microscope (AFM) provides unique capabilities for nanoscale characterization of photovoltaic materials and devices. It can probe local electrical and functional response in light or dark conditions with environmental control, and map surface structure with unprecedented resolution. In this webinar, we provide an overview of AFM applications for emerging photovoltaics including hybrid organic-inorganic perovskites and organic semiconductors. Our guest speaker, Dr. Rajiv Giridharagopal, discusses results using standard and advanced modes such as photoconductive AFM, piezoresponse force microscopy (PFM), and time-resolved electrostatic force microscopy. Additional results are presented to further illustrate the power and versatility of AFMs for photovoltaic R&D. | ![]() |
Key learning objectives:
Presented by Oxford Instruments Asylum Research