Towards “Damage-Free” TEM specimen preparation by Focused Ion Beam without Gallium

Nov 23, 2021

Collection: Webinars

Type: Session

Speakers:

• Chengge Jiao, Staff Scientist, Applications Development, Thermo Fisher Scientific
• Brandon Van Leer, Product Marketing Engineer SEM / DualBeam, Thermo Fisher Scientific

Tags: focused ion beam ion solid interaction plasma ion beam FIB speciment preparation low energy ion beam argon multi-ion source