An Introduction to Atom Probe Tomography and Its Applications

Jun 6, 2018

Collection: OnDemand Webinar Series

Type: Session

Speakers:

• Katherine Rice, Applications Scientist, CAMECA Instruments, Inc.

Tags: nanoscale metal dielectric microstructure phase transformation semiconductors silicon high temperature alloys thin film II-VI III-V composite TEM microscopy transmission electron microscopy scanning probe microscopy chemical composition electrical properties plasma