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MRS OnDemand

An Introduction to Atom Probe Tomography and Its Applications

An Introduction to Atom Probe Tomography and Its Applications

Jun 6, 2018
Collection: OnDemand Webinar Series
Credits: None available.
Type: Session
Speakers:
  • Katherine Rice, Applications Scientist, CAMECA Instruments, Inc.
Tags: nanoscale metal dielectric microstructure phase transformation semiconductors silicon high temperature alloys thin film II-VI III-V composite TEM microscopy transmission electron microscopy scanning probe microscopy chemical composition electrical properties plasma
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