This tutorial introduces the audience to the basics, principles, and applications of two advanced TEM imaging techniques.
In contrast to the scintillator-based Charged Coupled Device (CCD) commonly used in TEM, direct electron detectors produce images directly from high energy electrons. The high sensitivity and high speed properties of these advanced detectors have provided material scientists with a tool to study dynamic processes at the milliseconds time scale while maintaining spatial resolution of sub-nanometer and better. In this, Part 1 of a two-part tutorial, Liang Jin covers the physics of image formation, different imaging modes including electron counting, and new image processing methods for in situ observations. Applications of the technique to in situ mechanical, liquid cell and environmental TEM are given.
This is Part One of a two-part tutorial. Part Two, Introduction to Advanced Imaging and Tomography Techniques for Transmission Electron Microscopy: Three-Dimensional Electron Tomographic for Hard and Soft Materials Research, is available here.