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This tutorial introduces the audience to the basics, principles, and applications of two advanced TEM imaging techniques.
Three-dimensional (3D) structural analysis is essential to understand the relationship between the structure and function of an object. Electron tomography (ET) is a technique that retrieves 3D structural information from a tilt series of 2D projections, and is becoming a mature technology with sub-nanometer resolution. In Part 2 (of two) of this tutorial, Gang Ren discusses the common basis for 3D characterization, and specifies difficulties and solutions regarding both hard and soft materials research. Additionally, this part covers an overview of different experimental and computational techniques used in ET. Applications are given in 3D structural analysis of both physical-sciences research and soft materials and biomaterials research.
This is Part Two of a two-part tutorial. Part One, Introduction to Advanced Imaging and Tomography Techniques for Transmission Electron Microscopy: High-Speed Direct Electron Detectors for In Situ TEM, is available here.
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