Run time: 66m

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OnDemand Webinar Series

AFM Characterization of Emerging Photovoltaics

Sep 13, 2018 11:30am ‐ Sep 13, 2018 12:30pm


Presented by Oxford Instruments Asylum Research

The atomic force microscope (AFM) provides unique capabilities for nanoscale characterization of photovoltaic materials and devices. It can probe local electrical and functional response in light or dark conditions with environmental control, and map surface structure with unprecedented resolution. In this webinar, we provide an overview of AFM applications for emerging photovoltaics including hybrid organic-inorganic perovskites and organic semiconductors. Our guest speaker, Dr. Rajiv Giridharagopal, discusses results using standard and advanced modes such as photoconductive AFM, piezoresponse force microscopy (PFM), and time-resolved electrostatic force microscopy. Additional results are presented to further illustrate the power and versatility of AFMs for photovoltaic R&D.



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Sergey Luchkin
9/24/18 4:39 am

Thanks for the interesting and useful webinar. A small comment on the answer regarding illumination from the top. We did it with the BlueDrive laser using the top view probe to prevent shading of the measured point by the lever. To my experience, a Rocky Mountain probe has a longest protruding tip so the tip-surface contact point is visible from the top and can be illuminated by the laser at all practical cantilever inclinations.