Nanoscale Tomography Using X-rays and Electrons

Description

Three-dimensional (3D) tomographic imaging, using x-rays or electrons, of the structural, chemical, and physical properties of a material provides key knowledge that links the structure of a material to its processing, which is central to studies across a broad spectrum of materials. For decades, tomography using x-rays or electrons has proven to be an essential 3D characterization tool. In recent years, advances in technology have enabled new imaging capabilities at the nanometer or atomic scale for 3D reconstruction.

The April 2020 issue of MRS Bulletin discusses developments, techniques, and future directions for 3D tomographic imaging. This webinar expanded upon and complemented the MRS Bulletin issue with talks from leading experts in the field. An interactive Q&A session followed each of the talks.

Talk Presentations:

• High-dimensional and high-resolution x-ray tomography for energy materials science
  Yijin Liu, Stanford University
  Talk begins at 10:54 
     
• Electron Tomography for Functional Nanomaterials
  Robert Hovden, University of Michigan
  Talk begins at 41:10
     
• Atomic Electron Tomography: Adding New Dimensions to Pinpoint Single Atoms in Materials
  Jianwei (John) Miao, UCLA
  Talk begins at 1:11:33
     

Sponsored by American Elements

Host(s):

• Huolin Xin, University of California, Irvine

Speaker(s):

• Yijin Liu, Stanford University
• Robert Hovden, University of Michigan
• Jianwei (John) Miao, UCLA