Chengge Jiao

Chengge Jiao is a staff scientist for application development in Thermo Fisher Scientific in Eindhoven, the Netherlands. He joined the company in the UK as a FIB application engineer about 20 years ago after a post-doctoral researcher position in the school of physics, university Bristol, UK where he worked on electron holography of GaN materials by a cold-FEG TEM. He is an experienced electron microscopist with knowledge of materials science. His current interest is to apply multi-ions species (Xe+, O+, Ar+, N+) Plasma Focused Ion Beam (MIS-PFIB) and FIB-SIMS for material science applications. Chengge received his PhD in materials science from the University of Birmingham, UK on an investigation of dislocation microstructures in MoSi₂ intermetallic by TEM. He has authored or co-authored over 50 publications including in Physical Review Letters (PRL), Nature Materials, Acta Materialia.