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An Introduction to Atom Probe Tomography and Its Applications
Jun 6, 2018
Collection: OnDemand Webinar Series
Credits: None available.
Type:
Session
Speakers:
Katherine Rice
, Applications Scientist,
CAMECA Instruments, Inc.
Tags:
nanoscale
metal
dielectric
microstructure
phase transformation
semiconductors
silicon
high temperature
alloys
thin film
II-VI
III-V
composite
TEM
microscopy
transmission electron microscopy
scanning probe microscopy
chemical composition
electrical properties
plasma
